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Jeol Arm200f Manual Dexterity

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by banmeyclarsel1986 2020. 2. 20. 04:52

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Since its introduction, the JEOL ARM series with spherical aberration correction has become the leading atomic resolution microscope used in advanced research.In response to the increased need for high-resolution imaging of materials containing light elements and of specimens susceptible to electron-beam irradiation, JEOL developed the NEOARM atomic resolution analytical electron microscope.The NEOARM enables atomic-resolution imaging at accelerating voltages ranging from 30 kV to 200 kV. The NEOARM features a unique cold field emission gun (Cold-FEG) as well as a next generation Cs corrector (ASCOR) that compensates for higher order aberrations.An automated aberration correction system incorporates JEOL’s new aberration correction algorithm for fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging, even at low accelerating voltages.Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM imaging technique, e-ABF: enhanced ABF, facilitating observation of light-element materials. Cs corrector 'ASCOR' (Advanced STEM Corrector)The ASCOR incorporated in the NEOARM suppresses the six-fold astigmatism that limits resolution after Cs correction.

This combination of ASCOR with a Cold-FEG achieves higher resolution than ever, 0.071nm in HAADF-STEM, with unprecedented resolution at low voltages.Automated aberration correction software JEOL COSMO™ (Corrector System Module)JEOL COSMO™ adopts a new aberration correction algorithm SRAM: Segmented Ronchigram Auto-correlation function Matrix. No special sample is required for aberration correction, leading to high-precision and quick correction of higher order aberrations up to 5th order.

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This system enables fast processing compared to the conventional correction algorithm, and automates this operation, thus eliminating a complicated correction workflow. These features enable higher-throughput atomic-resolution imaging.New ABF (Annular Bright Field) detector systemThe ABF detector is widely used as a technique suitable for high-resolution imaging of light elements. NEOARM supports enhanced contrast of light elements by a newly-designed ABF imaging technique, e-ABF:enhanced ABF. This capability facilitates atomic-level structure observation of materials containing light elements.Perfect sight detectorThe perfect sight detector, integrated into NEOARM, uses hybrid scintillators. This detector enables acquisition of high-contrast and quantitative STEM images over the complete range of accelerating voltage values.Viewing Camera systemThe Viewing Camera system, intended to be used for remote operation, is an image observation system that uses dual cameras. This system allows for remote operation in a room separated from the microscope room and also enables the smart exterior designing of the NEOARM.

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'NEOARM' / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.'

NEOARM' is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging.Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM imaging technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages.The microscope room is separated from the operation room to respond to a remote operation.

In addition, JEOL products’ new concept colors of 'pure white' and 'JEOL silver' are adopted, leading to a sophisticated exterior design of 'NEOARM'. Spherical aberration (Cs) corrector ASCOR (Advanced STEM Corrector)ASCOR incorporated in 'NEOARM' can suppress the six-fold astigmatism which limits resolution after Cs correction. The combination of ASCOR and Cold FEG gives low chromatic aberration and expands the diffraction limit, achieving higher resolution than ever.

Automatic aberration correction software JEOL COSMO™(Corrector System Module)JEOL COSMO™ adopts a new aberration correction algorithm (SRAM: Segmented Ronchigram Auto-correlation function Matrix). Thus, no special sample is required for aberration correction, leading to high-precision and quick correction of higher order aberrations.

This system enables fast processing compared to the conventional correction algorithm and also automates the operations, thus eliminating a complicated correction workflow in the customer microscope. These features enable higher-throughput atomic-resolution imaging.

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Jeol Arm200f Manual Dexterity

New ABF (Annular Bright Field) detector systemThe ABF detector is widely used as a technique suitable for high-resolution imaging of light elements. 'NEOARM' supports enhanced contrast of light elements by a newly-designed ABF imaging technique (e-ABF:enhanced ABF). This capability facilitates atomic-level structure observation of materials containing light elements. Perfect sight detectorThe perfect sight detector, integrated into 'NEOARM', uses hybrid scintillators. This detector always enables the acquisition of high-contrast and quantitative STEM images, irrespective of accelerating voltage settings. Viewing Camera system'NEOARM' comes with the Viewing Camera system.

This image observation system uses a dual camera, intended to be used for remote operations. Thus, the system allows for the remote operations in a room separated from the microscope room and also enables a flexible operation environment. In addition, the NEOARM adopts JEOL products’ new concept colors of 'pure white' and 'JEOL silver' for a sophisticated exterior design. Link. News ReleaseCatalogue Download.